Failure Analysis and General Purpose Systems
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Application Overview: For failure analysis and other general analytical purposes, the Hyphenated Systems family of upright and inverted confocal microscopes provides engineers and QA personnel the accurate 3 dimensional data required to make key decisions in both R&D and production environments. The HS OP and 3D MAP platforms combine rapid, user friendly, non-contact analysis capability with nanoscale Z feature resolutions. Our easy to use software provides several critical measurement tools, stunning 3D images, and the ability to perform efficient automated acquisitions and measurements. |
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Interactive to Fully Automated For labs which analyze a wide variety of different samples, our systems are offered on lower cost, fully interactive (manual) versions which provide this powerful 3D imaging technology at cost that is highly competitive. Where large volume inspections and high thoughputs are needed, all of our platforms can be outfitted with various levels of automation equipment. From automatic stages to full wafer handling robotic systems, we can tailor high throughput automated inspection systems that meet specific application requirements. |
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3 Inspection Modes The Hyphenated Systems upright microscope platforms are adapted to the highly capable Nikon Eclipse series of semiconductor inspection microscope platforms. These platforms utilize high quality Nikon optics, hyphenating our unique advanced confocal microscopy with high resolution, reduced flare standard brightfield and darkfield inspection techniques. This unique combination provides users the added value of 3 unique and powerful inspection techniques on a single, flexible, versatile analysis platform. Immediate Advantages: |
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