HS200OP
The Hyphenated Systems HS200 OP optical profiler is an ideal choice for research, engineering, and production groups. Combining the latest in confocal technology and nanometer scale height measurements with the ease of use of a conventional microscope it enables 3-dimensional surface measurement and visualization with unprecedented resolution and range.
The Hyphenated Systems HS200 OP optical profiler is an ideal choice for research, engineering, and production groups. Combining the latest in confocal technology and nanometer scale height measurements with the ease of use of a conventional microscope it enables 3-dimensional surface measurement and visualization with unprecedented resolution and range. The NanoScale 200 OP is designed for fast and non-invasive inspection and measurement of the 3-dimensional geometry of microchannels, ICs, MEMS, micro lenses and similar micro- and nano-engineered or precision-machined structures. As well as everyday measurements, the 200 OP is especially suited to measurements of high curvature, steep slope, rough surfaces and for measurements beneath glass windows or engineered semi-transparent films.
NanoScale optical profilers allow researchers and engineers to tackle virtually any measurement task. Using Advanced Confocal Technologies, the NanoScale profilers can deliver high ratio x y z data and image rendering. The familiar light microscope of the 200 OP provides an easy-to-use platform allowing immediate access to the powerful world of 3-dimensional measurement. Other members of the NanoScale family extend this capability with longer working distances, scanned probe techniques and with full automation capabilities, while retaining the same accessibility and ease-of-use.
NanoScale Analysis Software Developed in close collaboration with research and engineering groups, NanoScale Analysis Software (NAS) allows rapid data reduction and data sharing with common engineering packages. The NanoScale Analysis Software offers total system flexibility. The systems are scaleable and can be easily upgraded for larger sample sizes and automated inspection and metrology protocols from a user-friendly graphical interface.
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